M. de la Bardonnie: search on Z-Library

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1

Junction parameters for silicon devices characterization

M. de la Bardonnie, N. Toufik, C. Salamé, S. Dib, P. Mialhe, A. Hoffmann, J.-P. Charles

Journal:

Microelectronics Reliability

Year:

1999

Language:

english

File:

PDF, 223 KB

english, 1999

2

Fast and rigorous use of thermal time constant to characterize back end of the line test structure in advanced technology

Reverdy, A., Perdu, P., Murray, H., de la Bardonnie, M., Poirier, P.

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 873 KB

english, 2008

3

Subjective evaluation of the long-term efficacy of speech therapy on dysfunctional dysphonia

D. Morsomme, M. Faurichon de la Bardonnie, I. Verduyckt, J. Jamart, M. Remacle

Journal:

Journal of Voice

Year:

2010

Language:

english

File:

PDF, 81 KB

english, 2010

4

[IEEE 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. - Shangri-La's Rasa Sentosa Resort, Singapore (27 June-1July, 2005)] Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. - How effective are failure analysis methods for the 65nm cmos technology node?

Lamy, M., de la Bardonnie, M., Lorut, F., Ross, R., Ly, K., Wyon, C., Kwakman, L.F.Tz.

Year:

2005

Language:

english

File:

PDF, 2.51 MB

english, 2005

5

Dynamic study of the thermal laser stimulation response on advanced technology structures

A. Reverdy, M. de la Bardonnie, P. Poirier, H. Murray, P. Perdu, A. Boukkali

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 848 KB

english, 2008

6

Diode Parameter Determination Applied to LDD-MOSFETs for Device Characterization

De La Bardonnie, M., Mialhe, P., Bendada, E., Blampain, E., Hoffmann, A., Charles, J.-P.

Journal:

Active and Passive Electronic Components

Year:

1998

Language:

english

File:

PDF, 1.70 MB

english, 1998

7

Méthodologie pour une simulation des transformations granulométriques de sables de la zone d'avant-côte

Jean-Paul Barusseau, Mohamodoul B Diouf, Marc de la Bardonnie, Nagui El Ghandour

Journal:

Oceanologica Acta

Year:

1999

Language:

english

File:

PDF, 1.24 MB

english, 1999

8

[IEEE Third European Conference on Radiation and its Effects on Components and Systems - Arcachon, France (18-22 Sept. 1995)] Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems - Radiation induced degradation in power MOSFETs

Bendada, E., de la Bardonnie, M., Mialhe, P., Charles, J.-P., Blampain, E., Hoffmann, A.

Year:

1996

File:

PDF, 358 KB

1996

9

Characterization method for ionizing radiation degradation in power MOSFETs

de la Bardonnie, M., Maouad, A., Mialhe, P., Elmazria, O., Hoffmann, A., Lepley, B., Charles, J.-P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 600 KB

english, 1995

10

On the aging of avalanche light emission from silicon junctions

de la Bardonnie, M., Dong Jiang, Kerns, S.E., Kerns, D.V., Jr., Mialhe, P., Charles, J.-P., Hoffman, A.

Journal:

IEEE Transactions on Electron Devices

Year:

1999

Language:

english

File:

PDF, 240 KB

english, 1999

11

Diode ideality factor for MOSFETs characterization of dose effect

Bendada, E., Bardonnie, M. De La, Mialhe, P., Charles, J.-P.

Journal:

Radiation Effects and Defects in Solids

Year:

1996

Language:

english

File:

PDF, 465 KB

english, 1996

12

[IEEE 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 - Fontevraud, France (13-17 Sept. 1999)] 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) - Electrical and optical analysis of low fluence fast neutron damage to JFETs

Forster, S., Hoffmann, A., Charles, J.-P., Kerns, S.E., Kerns, D.V., de la Bardonnie, M., Mialhe, P.

Year:

2000

Language:

english

File:

PDF, 345 KB

english, 2000

13

The evolution of the substrate-drain junction parameters during electrical ageing for n-MOS transistor characterization

Bardonnie, Marc de la, Mialhe, Pierre, Charles, Jean Pierre

Journal:

Journal of Physics D Applied Physics

Year:

1998

Language:

english

File:

PDF, 164 KB

english, 1998

14

Determination of the interfacial dynamic velocity in silicon solar cells

B Azar, M de la Bardonnie, J Farah, A Khoury, F Pelanchon, P Mialhe

Journal:

Solar Energy Materials and Solar Cells

Year:

2000

Language:

english

File:

PDF, 303 KB

english, 2000

15

Effects of low dimensions on junction parameters of MOS devices

M de la Bardonnie, N Toufik, M El-Tahchi, F Pelanchon, P Mialhe

Journal:

Materials Science and Engineering: B

Year:

2000

Language:

english

File:

PDF, 312 KB

english, 2000

16

Light emission studies of total dose and hot carrier effects on silicon junctions

Kerns, S., Jiang, D., de la Bardonnie, M., Pelanchon, F., Barnaby, H., Kerns, D.V., Schrimpf, R.D., Bhuva, B.L., Mialhe, P., Hoffmann, A., Charles, J.-P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1999

Language:

english

File:

PDF, 362 KB

english, 1999

17

[IEEE RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - Cannes, France (15-19 Sept. 1997)] RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - The junction ideality factor for ageing characterization

de la Bardonnie, M., Dib, S., Mialhe, P., Charles, J.P.

Year:

1998

Language:

english

File:

PDF, 318 KB

english, 1998

18

A New Method for the Extraction of Diode Parameters Using a Single Exponential Model

Dib, S., De La Bardonnie, M., Khoury, A., Pelanchon, F., Mialhe, P.

Journal:

Active and Passive Electronic Components

Year:

2000

Language:

english

File:

PDF, 1.64 MB

english, 2000

19

Silicon oxide defects in aging of MOS electronic devices

Marc de la Bardonnie, Alain Maouad, Pierre Mialhe

Journal:

Journal of Non-Crystalline Solids

Year:

1997

Language:

english

File:

PDF, 302 KB

english, 1997

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